非饱和蒸汽试验/饱和蒸汽试验
HAST具有极高的湿气老化加速性,可最大程度缩短试验在常规条件下的时间。
HAST适用于密封性能的检测,加速寿命试验,适用于产品的设计及验证阶段,用于快速暴露产品的缺陷和薄弱环节。
HAST适用于评估储存在高温/高湿度环境中的半导体等电子元件、材料的耐久性或因环境引发的失效性。

With high moisture aging and acceleration, the test can be reduced to a maximum of time under normal conditions.
It is suitable for the test of sealing performance and accelerated life test, which is applicable to the design and verification stage of the product, which is used for the quick exposure of defects and weak links of products.
It is applicable to evaluate the durability of semiconductor devices stored in high temperature/high humidity environments.



型号 Model HAST-300-1 HAST-300-2 HAST-450-1 HAST-450-2
工作室容积(升)Test Space Volume (L) 17 17X2 57 57X2
测试区域尺寸(mm) 250φ×350 250φ×350(×2) 400φ×450 400φ×450(×2)
外形尺寸(mm)
Overall size(mm)
W 760 760 910 910
D 850 850 960 960
H 1500 1500 1780 1780
试验模式 Test Model 不饱和控制/饱和控制/干湿球控制 Unsaturated / Saturated/Dry - Wet Bulb control
温度范围 Temp.Range 100℃~162℃
湿度范围 Hum.Range 65%RH~100%RH
压力范围 Press.Range 0.019~0.393MPa 

备注
1.设备性能在环境温度+25℃,相对湿度65%RH下,无负载所测。The performance vulues refer to environmental +25℃ 65%RH,no loading.
2.外形尺寸未包含局部突出部分。The ledge is not included in the overall dimensions.

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